Zexin Zhong, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu. Field-Based Static Taint Analysis for Industrial Microservices. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 149-150, IEEE, 2022. [doi]
Abstract is missing.