A deep learning framework to early identify emerging technologies in large-scale outlier patents: an empirical study of CNC machine tool

Yuan Zhou 0001, Fang Dong, Yufei Liu, Liang Ran. A deep learning framework to early identify emerging technologies in large-scale outlier patents: an empirical study of CNC machine tool. Scientometrics, 126(2):969-994, 2021. [doi]

Abstract

Abstract is missing.