Ge Zhou, Wei Dong, Wanwei Liu, Hao Shi, Chi Hu, Liangze Yin. Optimizing Monitor Code Based on Patterns in Runtime Verification. In 2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017. pages 348-354, IEEE, 2017. [doi]
@inproceedings{ZhouDLSHY17,
title = {Optimizing Monitor Code Based on Patterns in Runtime Verification},
author = {Ge Zhou and Wei Dong and Wanwei Liu and Hao Shi and Chi Hu and Liangze Yin},
year = {2017},
doi = {10.1109/QRS-C.2017.65},
url = {https://doi.org/10.1109/QRS-C.2017.65},
researchr = {https://researchr.org/publication/ZhouDLSHY17},
cites = {0},
citedby = {0},
pages = {348-354},
booktitle = {2017 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017, Prague, Czech Republic, July 25-29, 2017},
publisher = {IEEE},
isbn = {978-1-5386-2072-4},
}