A composite rule combining due date control and WIP balance in a wafer fab

Zhugen Zhou, Oliver Rose. A composite rule combining due date control and WIP balance in a wafer fab. In S. Jain, Roy R. Creasey Jr., Jan Himmelspach, K. Preston White, Michael C. Fu, editors, Winter Simulation Conference 2011, WSC'11, Phoenix, AZ, USA, December 11-14, 2011. pages 2085-2092, WSC, 2011. [doi]

Abstract

Abstract is missing.