Generalized Metric Based Test Selection and Coverage Measure for Communication Protocols

Jinsong Zhu, Son T. Vuong. Generalized Metric Based Test Selection and Coverage Measure for Communication Protocols. In Atsushi Togashi, Tadanori Mizuno, Norio Shiratori, Teruo Higashino, editors, Formal Description Techniques and Protocol Specification, Testing and Verification, FORTE X / PSTV XVII 97, IFIP TC6 WG6.1 Joint International Conference on Formal Description Techniques for Distributed Systems and Communication Protocols (FORTE X) and Pr. Volume 107 of IFIP Conference Proceedings, pages 299-314, Chapman & Hall, 1997.

@inproceedings{ZhuV97,
  title = {Generalized Metric Based Test Selection and Coverage Measure for Communication Protocols},
  author = {Jinsong Zhu and Son T. Vuong},
  year = {1997},
  tags = {rule-based, test coverage, protocol, testing, coverage},
  researchr = {https://researchr.org/publication/ZhuV97},
  cites = {0},
  citedby = {0},
  pages = {299-314},
  booktitle = {Formal Description Techniques and Protocol Specification, Testing and Verification, FORTE X / PSTV XVII 97, IFIP TC6 WG6.1 Joint International Conference on Formal Description Techniques for Distributed Systems and Communication Protocols (FORTE X) and Pr},
  editor = {Atsushi Togashi and Tadanori Mizuno and Norio Shiratori and Teruo Higashino},
  volume = {107},
  series = {IFIP Conference Proceedings},
  publisher = {Chapman & Hall},
  isbn = {0-412-82060-9},
}