Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility

Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis. Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. In 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019. pages 582-585, IEEE, 2019. [doi]

Abstract

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