Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis. Process variability in FinFET standard cells with different transistor sizing techniques. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 121-124, IEEE, 2015. [doi]
Abstract is missing.