Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine. Failure Analysis and Test Solutions for Low-Power SRAMs. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 459-460, IEEE Computer Society, 2011. [doi]
Abstract is missing.