Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine. Defect analysis in power mode control logic of low-power SRAMs. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]
Abstract is missing.