Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang. Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 225-230, IEEE Computer Society, 2007. [doi]
Abstract is missing.