Loic Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson. Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. In 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2013, Arlington, VA, USA, May 6-7, 2014. pages 130-135, IEEE, 2014. [doi]
@inproceedings{ZussaDCR14,
title = {Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter},
author = {Loic Zussa and Jean-Max Dutertre and Jessy Clédière and Bruno Robisson},
year = {2014},
doi = {10.1109/HST.2014.6855583},
url = {http://dx.doi.org/10.1109/HST.2014.6855583},
researchr = {https://researchr.org/publication/ZussaDCR14},
cites = {0},
citedby = {0},
pages = {130-135},
booktitle = {2013 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2013, Arlington, VA, USA, May 6-7, 2014},
publisher = {IEEE},
}