Abstract is missing.
- An integrated method for designing user interfaces based on testsAlbert Schilling, Kelma Madeira, Paula Donegan, Kênia Soares Sousa, Elizabeth Furtado, Vasco Furtado. [doi]
- Model-based testing for applications derived from software product linesErika Mir Olimpiew, Hassan Gomaa. [doi]
- Modeling for image processing system validation, verification and testingXing Li, Ramesh Nagarajan. [doi]
- Requirements traceability in automated test generation: application to smart card software validationFabrice Bouquet, Eddie Jaffuel, Bruno Legeard, Fabien Peureux, Mark Utting. [doi]
- Generating optimal distinguishing sequences with a model checkerChristopher Robinson-Mallett, Peter Liggesmeyer, Tilo Mücke, Ursula Goltz. [doi]
- Environment behavior models for scenario generation and testing automationMikhail Auguston, James Bret Michael, Man-tak Shing. [doi]
- Distributed performance testing using statistical modelingAlan F. Karr, Adam A. Porter. [doi]
- Usage model-based automated testing of C++ templatesKirk Sayre. [doi]
- A simulation model of a multi-server EJB systemDavid McGuinness, Liam Murphy. [doi]
- Modeling requirements for combinatorial software testingChristopher M. Lott, Ashish Jain, Siddhartha R. Dalal. [doi]
- Using information about functions in selecting test casesMarkus Clermont, David Lorge Parnas. [doi]
- Case studies on fault detection effectiveness of model based test generation techniquesAmit M. Paradkar. [doi]
- Test prioritization for pairwise interaction coverageRenée C. Bryce, Charles J. Colbourn. [doi]
- The effect of code coverage on fault detection under different testing profilesXia Cai, Michael R. Lyu. [doi]
- Model-based specification and testing applied to the Ground-Based Midcourse Defense (GMD) system: an industry reportPeter B. Lakey. [doi]
- Early estimation of defect density using an in-process Haskell metrics modelMark Sherriff, Nachiappan Nagappan, Laurie A. Williams, Mladen A. Vouk. [doi]
- The advanced mobile application testing environmentRobert V. Binder, James E. Hanlon. 1 [doi]