Advanced thermal simulation of SiGe: C HBTs including back-end-of-line

Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger. Advanced thermal simulation of SiGe: C HBTs including back-end-of-line. Microelectronics Reliability, 67:38-45, 2016. [doi]

Authors

Vincenzo d'Alessandro

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Alessandro Magnani

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Lorenzo Codecasa

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Niccolò Rinaldi

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Klaus Aufinger

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