Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations

Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace. Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. Microelectronics Reliability, 53(9-11):1713-1718, 2013. [doi]

Authors

Vincenzo d'Alessandro

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Alessandro Magnani

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Michele Riccio

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Yohei Iwahashi

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Giovanni Breglio

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Niccolò Rinaldi

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Andrea Irace

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