Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace. Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. Microelectronics Reliability, 53(9-11):1713-1718, 2013. [doi]
@article{dAlessandroMRIBRI13,
title = {Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations},
author = {Vincenzo d'Alessandro and Alessandro Magnani and Michele Riccio and Yohei Iwahashi and Giovanni Breglio and Niccolò Rinaldi and Andrea Irace},
year = {2013},
doi = {10.1016/j.microrel.2013.07.083},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.083},
researchr = {https://researchr.org/publication/dAlessandroMRIBRI13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1713-1718},
}