Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations

Vincenzo d'Alessandro, Alessandro Magnani, Michele Riccio, Yohei Iwahashi, Giovanni Breglio, Niccolò Rinaldi, Andrea Irace. Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations. Microelectronics Reliability, 53(9-11):1713-1718, 2013. [doi]