Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. IEEE Computer Society, 2007.
Conference: dft2007
@proceedings{dft:2007, title = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy}, year = {2007}, researchr = {https://researchr.org/publication/dft%3A2007}, cites = {0}, citedby = {0}, booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy}, conference = {dft}, editor = {Cristiana Bolchini and Yong-Bin Kim and Adelio Salsano and Nur A. Touba}, publisher = {IEEE Computer Society}, isbn = {0-7695-2885-6}, }