22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy

Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. IEEE Computer Society, 2007.

Conference: dft2007

@proceedings{dft:2007,
  title = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy},
  year = {2007},
  researchr = {https://researchr.org/publication/dft%3A2007},
  cites = {0},
  citedby = {0},
  booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy},
  conference = {dft},
  editor = {Cristiana Bolchini and Yong-Bin Kim and Adelio Salsano and Nur A. Touba},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2885-6},
}