Abstract is missing.
- Evaluating the impact of spike and flicker noise in phase change memoriesSalin Junsangsri, Fabrizio Lombardi, Jie Han. 1-6 [doi]
- Fault detection and repair of DSC arrays through memristor sensingJimson Mathew, Yuamfam Yang, M. Ottavia, T. Browna, A. Zampettia, A. Di Carloa, A. M. Jabirb, Dhiray K. Pradhan. 7-12 [doi]
- Asymmetric ECC organization in 3D-memory via spare column utilizationHyunseung Han, Joon-Sung Yang. 13-16 [doi]
- Exploring error-tolerant low-power multiple-output read scheme for memristor-based memory arraysAdedotun A. Adeyemo, Jimson Mathew, Abusaleh M. Jabir, Dhiraj K. Pradhan. 17-20 [doi]
- RotR: Rotational redundant task mapping for fail-operational MPSoCsBadrun Nahar, Brett H. Meyer. 21-28 [doi]
- On enhancing the debug architecture of a system-on-chip (SoC) to detect software attacksJerry Backer, David Hély, Ramesh Karri. 29-34 [doi]
- Software-based on-chip thermal sensor calibration for DVFS-enabled many-core systemsSami Teravainen, Mohammad Hashem Haghbayan, Amir-Mohammad Rahmani, Pasi Liljeberg, Hannu Tenhunen. 35-40 [doi]
- Single Event Upsets and Hot Pixels in digital imagersGlenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren. 41-46 [doi]
- Accelerated microarchitectural Fault Injection-based reliability assessmentManolis Kaliorakis, Sotiris Tselonis, Athanasios Chatzidimitriou, Dimitris Gizopoulos. 47-52 [doi]
- Hot spare components for performance-cost improvement in multi-core SIMTSeyyed Hasan Mozafari, Brett H. Meyer. 53-59 [doi]
- Low-overhead fault-tolerance for the preconditioned conjugate gradient solverAlexander Scholl, Claus Braun, Michael A. Kochte, Hans-Joachim Wunderlich. 60-65 [doi]
- On-line detection of intermittent faults in digital-to-analog convertersMani Soma. 66-71 [doi]
- A Dual-Layer Fault Manager for systems based on Xilinx Virtex FPGAsIgnacio Herrera-Alzu, Marisa López-Vallejo, C. Gil Soriano. 72-75 [doi]
- REPAIR: Hard-error recovery via re-executionJyothish Soman, Negar Miralaei, Alan Mycroft, Timothy M. Jones. 76-79 [doi]
- A method to protect Bloom filters from soft errorsPedro Reviriego, Salvatore Pontarelli, Juan Antonio Maestro, Marco Ottavi. 80-84 [doi]
- Influence of triple-well technology on laser fault injection and laser sensor efficiencyNicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre. 85-90 [doi]
- Using value similarity of registers for soft error mitigationAbdulaziz Eker, Oguz Ergin. 91-96 [doi]
- Security analysis of logic encryption against the most effective side-channel attack: DPAMuhammad Yasin, Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu. 97-102 [doi]
- Reliable hash trees for post-quantum stateless cryptographic hash-based signaturesMehran Mozaffari Kermani, Reza Azarderakhsh. 103-108 [doi]
- Chip-level anti-reverse engineering using transformable interconnectsShuai Chen, JunLin Chen, Domenic Forte, Jia Di, Mark Tehranipoor, Lei Wang. 109-114 [doi]
- Scan attack on Elliptic Curve CryptosystemSk Subidh Ali, Ozgur Sinanoglu. 115-118 [doi]
- Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscationSenwen Kan, Marco Ottavi, Jennifer Dworak. 119-122 [doi]
- A BIST approach for counterfeit circuit detection based on NBTI degradationPuneet Ramesh Savanur, Phaninder Alladi, Spyros Tragoudas. 123-126 [doi]
- Quest for a quantum search algorithm for testing stuck-at faults in digital circuitsMuralidharan Venkatasubramanian, Vishwani D. Agrawal, James J. Janaher. 127-132 [doi]
- Piecewise-functional broadside tests based on intersections of reachable statesIrith Pomeranz. 133-138 [doi]
- Predictive LBIST model and partial ATPG for seed extractionGustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark Mohammad Tehranipoor. 139-146 [doi]
- A CMOS ripple detector for integrated voltage regulator testingCagatay Ozmen, Aydin Dirican, Nurettin Tan, Hieu Nguyen, Martin Margala. 147-150 [doi]
- Adaptive fault simulation on many-core microprocessor systemsMohammad Hashem Haghbayan, Sami Teravainen, Amir-Mohammad Rahmani, Pasi Liljeberg, Hannu Tenhunen. 151-154 [doi]
- Compacting output responses containing unknowns using an embedded processorKamran Saleem, Sreenivaas S. Muthyala, Nur A. Touba. 155-160 [doi]
- Impact of test compression on power supply noise controlTengteng Zhang, D. M. H. Walker. 161-166 [doi]
- Improving X-tolerant combinational output compaction via input rotationAsad Amin Bawa, Nur A. Touba. 167-170 [doi]
- Low-power LDPC decoder design exploiting memory error statisticsJunLin Chen, Lei Wang. 171-176 [doi]
- SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technologyClement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos. 177-182 [doi]
- Approximate compressors for error-resilient multiplier designZhixi Yang, Jie Han, Fabrizio Lombardi. 183-186 [doi]
- Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronicsDaniele Felici, Sandro Bonacini, Marco Ottavi. 187-190 [doi]
- Reducing the performance overhead of resilient CMPs with substitutable resourcesAlirad Malek, Stavros Tzilis, Danish Anis Khan, Ioannis Sourdis, Georgios Smaragdos, Christos Strydis. 191-196 [doi]
- Dependable real-time task execution scheme for a many-core platformTomohiro Yoneda, Masashi Imai, Hiroshi Saito, Kenji Kise. 197-204 [doi]
- Towards reliability and performance-aware Wireless Network-on-Chip designMichael Opoku Agyeman, Kin-Fai Tong, Terrence S. T. Mak. 205-210 [doi]
- A fast and scalable fault injection framework to evaluate multi/many-core soft error reliabilityFelipe Rosa, Fernanda Lima Kastensmidt, Ricardo Reis, Luciano Ost. 211-214 [doi]
- A cross-layer approach to online adaptive reliability prediction of transient faultsBahar J. Farahani, Saeed Safari. 215-220 [doi]
- A non-conservative software-based approach for detecting illegal CFEs caused by transient faultsDiego G. Rodrigues, Ghazaleh Nazarian, Álvaro F. Moreira, Luigi Carro, Georgi Gaydadjiev. 221-226 [doi]
- A configurable board-level adaptive incremental diagnosis technique based on decision treesCristiana Bolchini, Luca Cassano. 227-232 [doi]
- IntelliCAN: Attack-resilient Controller Area Network (CAN) for secure automobilesMohammad Raashid Ansari, Shucheng Yu, Qiaoyan Yu. 233-236 [doi]