Abstract is missing.
- On the Application of Egocentric Computer Vision to Industrial InspectionVivek Chavan, Oliver Heimann, Jörg Krüger. 1-17 [doi]
- Neurosymbolic Visual Transform Based on Logic Tensor Network for Defect DetectionYoucef Djenouri, Ahmed Nabil Belbachir, Asma Belhadi, Tomasz P. Michalak. 18-34 [doi]
- Multimodal Computer Vision Techniques for Wooden Utility Pole Density Estimation with Contact-Free SensingLuis Gonzalez-Naharro, Arnoud Jochemsen, Nabil Belbachir, Erik T. Hauge. 35-49 [doi]
- Dynamic Label Injection for Imbalanced Industrial Defect SegmentationEmanuele Caruso, Francesco Pelosin, Alessandro Simoni, Marco Boschetti. 50-64 [doi]
- XAI-Guided Insulator Anomaly Detection for Imbalanced DatasetsMaximilian Andreas Hoefler, Karsten Müller 0001, Wojciech Samek. 65-81 [doi]
- Exploring Multi-modal Neural Scene Representations With Applications on Thermal ImagingMert Özer, Maximilian Weiherer, Martin Hundhausen, Bernhard Egger 0001. 82-98 [doi]
- Foreground-Aware Knowledge Distillation for Enhanced Damage DetectionPantelis Menteidis, Christos Papaioannidis, Ioannis Pitas. 99-115 [doi]
- AnomalyFactory: Regard Anomaly Generation as Unsupervised Anomaly LocalizationYing Zhao 0009. 116-132 [doi]
- Interactive Explainable Anomaly Detection for Industrial SettingsDaniel Gramelt, Timon Höfer, Ute Schmid. 133-147 [doi]
- DAS3D: Dual-Modality Anomaly Synthesis for 3D Anomaly DetectionKecen Li, Bingquan Dai, Jingjing Fu, Xinwen Hou. 148-165 [doi]
- SQUAD: Scalar Quantized Representation Learning for Unsupervised Anomaly Detection and LocalizationShih Chih Lin, Shang-Hong Lai. 166-182 [doi]
- Deep Unsupervised Segmentation of Log Point CloudsFedor Zolotarev, Tuomas Eerola, Tomi Kauppi. 183-196 [doi]
- A Computer Vision System for Automatic Edge Detection of Magnetic Grain ProfileZhe Liu, Ying Weng, Yiming Zhang. 197-210 [doi]
- Find the Assembly Mistakes: Error Segmentation for Industrial ApplicationsDan Lehman, Tim J. Schoonbeek, Shao-Hsuan Hung, Jacek Kustra, Peter H. N. de With, Fons van der Sommen. 211-227 [doi]
- Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC NodesBappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt. 228-243 [doi]
- On The Relationship Between Visual Anomaly-Free and Anomalous RepresentationsRiya Sadrani, Ayush Bachan, Hrishikesh Sharma. 244-258 [doi]
- DIE-VIS: An Automated Visual Inspection System for Cardboard Box ManufacturingFlavia Monti, Matteo Marinacci, Francesco Leotta, Massimo Mecella. 259-275 [doi]
- When the Small-Loss Trick is Not Enough: Multi-label Image Classification with Noisy Labels Applied to CCTV Sewer InspectionsKeryan Chelouche, Marie Lachaize, Marine Bernard, Louise Olgiati, Rémi Cuingnet. 276-293 [doi]
- AnomalousPatchCore: Exploring the Use of Anomalous Samples in Industrial Anomaly DetectionMykhailo Koshil, Tilman Wegener, Detlef Mentrup, Simone Frintrop, Christian Wilms. 294-309 [doi]
- Self-supervised Models are Strong Industrial Few-Shot Defect Classification LearnersTeng Yang, Pengcheng Gao, Jinbao Wang, Yongliang Tang. 310-327 [doi]
- 2 Emissions in Maritime VesselsArnoud Jochemsen, Hege Indresand, Martin Chamberland, Etienne Drouin, Jan Robert Fiksdal, Xuan Zhang, Nabil Belbachir. 328-341 [doi]
- Temporal-Consistent CAMs for Weakly Supervised Video Segmentation in Waste SortingAndrea Marelli, Luca Magri, Federica Arrigoni, Giacomo Boracchi. 342-359 [doi]
- Sequential PatchCore: Anomaly Detection for Surface Inspection Using Synthetic ImpuritiesRunzhou Mao, Juraj Fulir, Christoph Garth, Petra Gospodnetic. 360-377 [doi]
- SplatPose+: Real-Time Image-Based Pose-Agnostic 3D Anomaly DetectionYizhe Liu, Yan-song Hu, Yuhao Chen 0001, John S. Zelek. 378-391 [doi]
- BBD-Polyp: Weakly Supervised Polyp Segmentation via Bounding Box and Depth MapThao Nguyen Phuong, Vinh Nguyen Duy, Hidetomo Sakaino. 392-408 [doi]
- Enstrect: A Stage-Based Approach to 2.5D Structural Damage DetectionChristian Benz, Volker Rodehorst. 409-427 [doi]
- An Augmentation-Based Model Re-adaptation Framework for Robust Image SegmentationZheming Zuo, Joseph Smith, Jonathan Stonehouse, Boguslaw Obara. 428-444 [doi]
- Meta Learning-Driven Iterative Refinement for Robust Anomaly Detection in Industrial InspectionMuhammad Aqeel, Shakiba Sharifi, Marco Cristani, Francesco Setti. 445-460 [doi]