Abstract is missing.
- A Process Toward Total Dependability - Airbus Fly-by-Wire ParadigmPascal Traverse, Isabelle Lacaze, Jean Souyris. 1 [doi]
- Building and Using Quorums Despite any Number of Process of CrashesRoy Friedman, Achour Mostéfaoui, Michel Raynal. 2-19 [doi]
- Failure Detection with Booting in Partially Synchronous SystemsJosef Widder, Gérard Le Lann, Ulrich Schmid. 20-37 [doi]
- Total Order Communications: A Practical AnalysisRoberto Baldoni, Stefano Cimmino, Carlo Marchetti. 38-54 [doi]
- Gracefully Degrading Fair Exchange with Security ModulesGildas Avoine, Felix C. Gärtner, Rachid Guerraoui, Marko Vukolic. 55-71 [doi]
- Adding Fault-Tolerance Using Pre-synthesized ComponentsSandeep S. Kulkarni, Ali Ebnenasir. 72-90 [doi]
- Efficiency of Dynamic Arbitration in TDMA ProtocolsJens Chr. Lisner. 91-102 [doi]
- An Architectural Framework for Detecting Process Hangs/CrashesNithin Nakka, Giacinto Paolo Saggese, Zbigniew Kalbarczyk, Ravishankar K. Iyer. 103-121 [doi]
- Energy Efficient Configuration for QoS in Reliable Parallel ServersDakai Zhu, Rami G. Melhem, Daniel Mossé. 122-139 [doi]
- Novel Generic Middleware Building Blocks for Dependable Modular Avionics SystemsChristophe Honvault, Marc Le Roy, Pascal Gula, Jean-Charles Fabre, Gérard Le Lann, Eric Bornschlegl. 140-153 [doi]
- Integrating Fault Tolerance and Load Balancing in Distributed Systems Based on CORBAA. V. Singh, Louise E. Moser, P. M. Melliar-Smith. 154-166 [doi]
- Performance Evaluation of Consistent Recovery Protocols Using MPICH-GFNamyoon Woo, Hyungsoo Jung, Dongin Shin, Hyuck Han, Heon Young Yeom, Taesoon Park. 167-178 [doi]
- An Approach to Experimentally Obtain Service Dependability Characteristics of the Jgroup/ARM SystemBjarne E. Helvik, Hein Meling, Alberto Montresor. 179-198 [doi]
- The Effectiveness of Choice of Programming Language as a Diversity Seeking DecisionMeine van der Meulen, Miguel A. Revilla. 199-209 [doi]
- Formal Safety Analysis of a Radio-Based Railroad Crossing Using Deductive Cause-Consequence Analysis (DCCA)Frank Ortmeier, Wolfgang Reif, Gerhard Schellhorn. 210-224 [doi]
- Dependability Challenges and Education PerspectivesHenrique Madeira. 225-225 [doi]
- Availability in Industry and Science - A Business Perspective -Manfred Reitenspieß. 226-229 [doi]
- Fast Run-Time Reconfiguration for SEU InjectionDavid de Andrés, José Albaladejo, Lenin Lemus, Pedro J. Gil. 230-245 [doi]
- Assembly-Level Pre-injection Analysis for Improving Fault Injection EfficiencyRaul Barbosa, Jonny Vinter, Peter Folkesson, Johan Karlsson. 246-262 [doi]
- A Data Mining Approach to Identify Key Factors in Dependability ExperimentsGergely Pintér, Henrique Madeira, Marco Vieira, István Majzik, András Pataricza. 263-280 [doi]
- PathCrawler: Automatic Generation of Path Tests by Combining Static and Dynamic AnalysisNicky Williams, Bruno Marre, Patricia Mouy, Muriel Roger. 281-292 [doi]
- A New Methodology and Tool Set to Execute Software Test on Real-Time Safety-Critical SystemsCaiazza Alessandro, Roberto Di Maio, Fernando Scalabrini, Fabio Poli, Leonardo Impagliazzo, Arturo M. Amendola. 293-304 [doi]
- A Grey-Box Approach to the Functional Testing of Complex Automatic Train Protection SystemsGiuseppe De Nicola, Pasquale di Tommaso, Rosaria Esposito, Francesco Flammini, Pietro Marmo, Antonio Orazzo. 305-317 [doi]
- Deterministic Test Vector Compression / Decompression Using an Embedded ProcessorMaciej Bellos, Dimitris Nikolos. 318-331 [doi]
- Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDsJaan Raik, Raimund Ubar, Sergei Devadze, Artur Jutman. 332-344 [doi]
- Structure-Based Resilience Metrics for Service-Oriented NetworksDaniel J. Rosenkrantz, Sanjay Goel, S. S. Ravi, Jagdish Gangolly. 345-362 [doi]
- Efficient Protection of Many-to-One CommunicationsMiklós Molnár, Alexandre Guitton, Bernard Cousin, Raymond A. Marie. 363-378 [doi]
- Impact of Faults in Combinational Logic of Commercial MicrocontrollersDaniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil. 379-390 [doi]
- Implementation of a Testing and Diagnostic Concept for an NPP Reactor Protection SystemTamás Bartha, István Varga, Alexandros Soumelidis, Géza Szabé. 391-402 [doi]
- COMPAS - Compressed Test Pattern Sequencer for Scan Based CircuitsOndrej Novák, Jirí Zahrádka, Zdenek Plíva. 403-414 [doi]
- Fault Links: Exploring the Relationship Between Module and Fault TypesJane Huffman Hayes, Inies C. M. Raphael, Vinod Kumar Surisetty, Anneliese Amschler Andrews. 415-434 [doi]
- Model-Based Identification of Fault-Prone ComponentsStefan Wagner, Jan Jürjens. 435-452 [doi]
- Regression Test Selection for Testable ClassesEliane Martins, Vanessa Gindri Vieira. 453-470 [doi]