Joint proceedings of the 3rd Workshop on Managing the Evolution and Preservation of the Data Web (MEPDaW 2017) and the 4th Workshop on Linked Data Quality (LDQ 2017) co-located with 14th European Semantic Web Conference (ESWC 2017), Portorož, Slovenia, May 28th-29th, 2017 - researchr publication

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Jeremy Debattista, Jürgen Umbrich, Javier D. Fernández, Anisa Rula, Amrapali Zaveri, Anastasia Dimou, Wouter Beek, editors, Joint proceedings of the 3rd Workshop on Managing the Evolution and Preservation of the Data Web (MEPDaW 2017) and the 4th Workshop on Linked Data Quality (LDQ 2017) co-located with 14th European Semantic Web Conference (ESWC 2017), Portorož, Slovenia, May 28th-29th, 2017. Volume 1824 of CEUR Workshop Proceedings, CEUR-WS.org, 2017. [doi]

Conference: esws2017

Abstract is missing.

Versioned Triple Pattern Fragments: A Low-cost Linked Data Interface Feature for Web ArchivesRuben Taelman, Miel Vander Sande, Ruben Verborgh, Erik Mannens. 1-11 [doi]

Exploring the Evolution and Provenance of Git Versioned RDF DataNatanael Arndt, Patrick Naumann, Edgard Marx. 12-27 [doi]

Time Travel Queries in RDF ArchivesMelisachew Wudage Chekol, Valeria Fionda, Giuseppe Pirrò. 28-42 [doi]

Computing Changesets for RDF Views of Relational DataVânia Maria P. Vidal, Narciso Arruda Jr, Matheus Cruz, Marco Antonio Casanova, Carlos Eduardo Brito, Valéria Magalhães Pequeno. 43-58 [doi]

Cross-domain Semantic Drift Measurement in Ontologies Using the SemaDrift Tool and MetricsThanos G. Stavropoulos, Efstratios Kontopoulos, Albert Meroño-Peñuela, Stavros Tachos, Stelios Andreadis, Yiannis Kompatsiaris. 59-72 [doi]

Temporal Evolution of Entity Relatedness using Wikipedia and DBpediaNarumol Prangnawarat, Conor Hayes. 73-87 [doi]

A Linked Data Profiling Service for Quality AssessmentNandana Mihindukulasooriya, Raúl García-Castro, Freddy Priyatna, Edna Ruckhaus, Nelson Saturno. 88-93 [doi]

Towards Ontology Quality AssessmentSilvio Mc Gurk, Charlie Abela, Jeremy Debattista. 94-106 [doi]

An Ontology-based Validation Approach to Resolve Conflicts in the Manufacturing Design ProcessKazunari Hashimoto, Yohei Yamane, Seiji Suzuki, Motoyuki Takaai, Masao Watanabe, Hiroshi Umemoto. 107-112 [doi]

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