Abstract is missing.
- A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection ModelsRoukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. 1-12 [doi]
- Fault Attacks Friendliness of Post-quantum CryptosystemsAlessandro Barenghi, Gerardo Pelosi. 1 [doi]
- Voronoi Based Multidimensional Parameter Optimization for Fault Injection AttacksMarius Eggert, Marc Stöttinger. 13-23 [doi]
- A Compositional Methodology to Harden Programs Against Multi-Fault AttacksEtienne Boespflug, Laurent Mounier, Marie-Laure Potet, Abderrahmane Bouguern. 24-35 [doi]
- Analysis of Arbitrary Waveform Generation for Voltage GlitchesStanislav Lyakhov, Vincent Immler. 36-47 [doi]
- A better practice for Body Biasing InjectionGeoffrey Chancel, Jean Marc Gallière, Philippe Maurine. 48-59 [doi]
- PicoEMP: A Low-Cost EMFI Platform Compared to BBI and Voltage Fault Injection using TDC & External VCC MeasurementsColin O'Flynn. 60-71 [doi]
- Fault Attacks on a Cloud-Assisted ECDSA White-Box Based on the Residue Number SystemChristophe Giraud 0001, Agathe Houzelot. 72-80 [doi]
- Forging Dilithium and Falcon Signatures by Single Fault InjectionSven Bauer, Fabrizio De Santis. 81-88 [doi]
- DeepCover DS28C36: A Hardware Vulnerability Identification and Exploitation Using T- Test and Double Laser Fault InjectionKarim M. Abdellatif, Olivier Hériveaux. 89-94 [doi]