Abstract is missing.
- Failure Mechanisms in Semiconductor Memory CircuitsRay Haythornthwaite. 7-13 [doi]
- Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault ModelsJun Zhao, Fred J. Meyer, Fabrizio Lombardi. 14-19 [doi]
- Optimizing Memory Tests by Analyzing Defect CoverageAlvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri. 20-28 [doi]
- Hierarchical Sector Biasing Organization for Flash MemoriesRino Micheloni, Matteo Zammattio, Giovanni Campardo, Osama Khouri, Guido Torelli. 29-33 [doi]
- Fast Voltage Regulator for Multilevel Flash MemoriesOsama Khouri, Rino Micheloni, Stefano Gregori, Guido Torelli. 34-38 [doi]
- Design Techniques for Embedded EEPROM Memories in Portable ASIC and ASSP SolutionsJean Michel Daga, Caroline Papaix, Marc Merandat, Stephane Ricard, Giuseppe Medulla, Jeanine Guichaoua, Daniel Auvergne. 39-46 [doi]
- Windowed MRAM Sensing SchemeRuili Zhang, William C. Black Jr., Marwan M. Hassoun. 47-58 [doi]
- Synchronous Dynamic Memory Test Construction: A Field ApproachJörg E. Vollrath. 59-64 [doi]
- Yield Analysis Methodology for Low Defectivity Wafer FabsKamal Rajkanan. 65-72 [doi]
- March Tests for Realistic Faults in Two-Port MemoriesSaid Hamdioui, A. J. van de Goor, Mike Rodgers, David Eastwick. 73-78 [doi]
- A Simple Built-In Self Test For Dual Ported SRAMsKhoan Truong. 79-84 [doi]
- Using GLFSRs for Pseudo-Random Memory BISTMichael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer. 85-94 [doi]
- Optimizing Memory Bandwidth with ILP Based Memory Exploration and Assignment for Low Power Embedded SystemsWen-Tsong Shiue. 95-100 [doi]
- 66MHz 2.3M Ternary Dynamic Content Addressable MemoryValerie Lines, Abdullah Ahmed, Peter Ma, Stanley Ma, Robert McKenzie, Hong-seok Kim, Cynthia Mar. 101-105 [doi]
- A Low Voltage Embedded Single Port SRAM Generator in a 0.18µm Standard CMOS ProcessC. Frey, F. Genevaux, C. Issartel, D. Turgis, Jean-Pierre Schoellkopf. 106-112 [doi]
- Diagnostic Testing of Embedded Memories Based on Output TracingDirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker. 113-118 [doi]
- Defect Analysis and Realistic Fault Model Extensions for Static Random Access MemoriesKamran Zarrineh, R. Dean Adams, Aneesha P. Deo. 119-124 [doi]
- Crosstalk in Deep Submicron DRAMsZemo Yang, Samiha Mourad. 125-130 [doi]