12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. IEEE Computer Society, 2004.
Conference: mtdt2004
@proceedings{mtdt:2004,
title = {12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA},
year = {2004},
tags = {testing, design},
researchr = {https://researchr.org/publication/mtdt%3A2004},
cites = {0},
citedby = {0},
booktitle = {12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA},
conference = {mtdt},
publisher = {IEEE Computer Society},
isbn = {0-7695-2193-2},
}