Abstract is missing.
- Case study of bandwidth management in SoC testingYu Huang. 1-6 [doi]
- An enhanced approach to reduce test application time through limited shift operations in scan chainsKonstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis. 1-4 [doi]
- Mitigating simple power analysis attacks on LSIB key logicSaurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch. 1-6 [doi]
- Peer pressure on identity: On requirements for disambiguating PUFs in noisy environmentPavithra Ramesh, Vinay C. Patil, Sandip Kundu. 1-4 [doi]
- Detecting a trojan die in 3D stacked integrated circuitsSoha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch. 1-6 [doi]