Abstract is missing.
- Vulnerability Analysis of HD Photo Image Viewer ApplicationsClifford C. Juan, James Bret Michael, Christopher S. Eagle. 1-7 [doi]
- A Pollution Attack Resistant Multicast Authentication Scheme Tolerant to Packet LossWarren W. Lin, Shiuhpyng Shieh, Jia-Chun Lin. 8-15 [doi]
- Evaluation of Power-Constant Dual-Rail Logic as a Protection of Cryptographic Applications in FPGAsSylvain Guilley, Laurent Sauvage, Jean-Luc Danger, Tarik Graba, Yves Mathieu. 16-23 [doi]
- An Experimental Evaluation of the Reliability of Adaptive Random Testing MethodsYu Liu, Hong Zhu. 24-31 [doi]
- Pairwise Testing in the Presence of Configuration Change CostShin Kimoto, Tatsuhiro Tsuchiya, Tohru Kikuno. 32-38 [doi]
- Historical Value-Based Approach for Cost-Cognizant Test Case Prioritization to Improve the Effectiveness of Regression TestingHyuncheol Park, Hoyeon Ryu, Jongmoon Baik. 39-46 [doi]
- Validating UML Statechart-Based Assertions Libraries for Improved Reliability and AssuranceDoron Drusinsky, James Bret Michael, Thomas W. Otani, Man-tak Shing. 47-51 [doi]
- Ensuring Reliability and Availability of Soft System BusMohammad Reza Selim, Yuichi Goto, Jingde Cheng. 52-59 [doi]
- A Method of Reliability Assessment Based on Deterministic Chaos Theory for an Open Source SoftwareYoshinobu Tamura, Shigeru Yamada. 60-66 [doi]
- Reliability Improvement of Real-Time Embedded System Using CheckpointingSang-Moon Ryu. 67-72 [doi]
- Dynamic Performance Analysis for Software System Considering Real-Time Property in Case of NHPP Task ArrivalKoichi Tokuno, Shigeru Yamada. 73-80 [doi]
- Shortening Test Case Execution Time for Embedded SoftwareValdivino A. Santiago, Wendell Pereira da Silva, N. L. Vijaykumar. 81-88 [doi]
- A Blind Watermarking Scheme Based on Wavelet Tree QuantizationWei-Hung Lin, Yuh-Rau Wang, Shi-Jinn Horng. 89-95 [doi]
- Lightweight, Distributed Key Agreement Protocol for Wireless Sensor NetworksChe-Cheng Lin, Shiuhpyng Shieh, Jia-Chun Lin. 96-102 [doi]
- Automated Fault Diagnosis in Embedded SystemsPeter Zoeteweij, Jurryt Pietersma, Rui Abreu, Alexander Feldman, Arjan J. C. van Gemund. 103-110 [doi]
- Two Methods for Estimating Product Lifetimes from only Warranty Claims DataKazuyuki Suzuki, Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto. 111-119 [doi]
- Adaptive Car Plate Recognition in QoS-Aware Security NetworkPei-Chen Tseng, Jiun-Kuei Shiung, Chun-Ting Huang, Shih-Mine Guo, Wen-Shyang Hwang. 120-127 [doi]
- GUI Test Script Organization with Component AbstractionWoei-kae Chen, Zheng-Wen Shen, Che-Ming Chang. 128-134 [doi]
- Which Spot Should I Test for Effective Embedded Software Testing?Jooyoung Seo, Yuhoon Ki, Byoungju Choi, Kwanghyun La. 135-142 [doi]
- FPGA-Based Fault Injection into Synthesizable Verilog HDL ModelsMohammad Shokrollah-Shirazi, Seyed Ghassem Miremadi. 143-149 [doi]
- Two-Dimensional Software Reliability Assessment with Testing-CoverageShinji Inoue, Shigeru Yamada. 150-157 [doi]
- A Study of Estimation for the Three-Parameter Weibull Distribution Based on Doubly Type-II Censored Data Using a Least Squares MethodHideki Nagatsuka. 158-165 [doi]
- Proposal for a Communication Link Model Based on Resonance Frequency of Network UsersMasato Uwajima, Toru Sasaki, Chisa Takano, Masaki Aida. 166-172 [doi]
- Towards an Interface causing Discomfort for Security: A User Survey on the Factors of DiscomfortYasuhiro Fujihara, Hitomi Oikawa, Yuko Murayama. 173-174 [doi]
- Improving Software Integration from Requirement Process with a Model-Based Object-Oriented ApproachChih-Hung Chang, Chih-Wei Lu, William C. Chu. 175-176 [doi]
- An Enhanced Model for Early Software Reliability Prediction Using Software Engineering MetricsK. Saravana Kumar, R. B. Misra. 177-178 [doi]
- Application to Artificial Hip Stem Design of an Emergent Design System Applicable in the Early Process of DesignKoichiro Sato, Yoshiki Ujiie, Yoshiyuki Matsuoka. 179-180 [doi]
- Application of Design for Six Sigma in Third Party Intensive ProgramsSubramanyam Ranganathan, Cvetan Redzic. 181-182 [doi]
- Risk-Driven Software Reliability and TestingNorman F. Schneidewind, Michael G. Hinchey. 183-184 [doi]
- A Model of Bug Dynamics for Open Source SoftwareFengzhong Zou, Joseph Davis. 185-186 [doi]
- Co-Simulation of Networked Embedded System: Verification ApproachNikhil Damle, Avinash G. Keskar. 187-188 [doi]
- Text Extraction in Video ImagesShwu-Huey Yen, Chun-Wei Wang, Jih Pin Yeh, Meng-Ju Lin, Hwei-Jen Lin. 189-190 [doi]
- A Study of Visibility Evaluation for the Combination of Character Color and Background Color on a Web PageNobuyuki Nishiuchi, Kimihiro Yamanaka, Kunie Beppu. 191-192 [doi]
- An Ant Colony Optimization Approach to Multi-Objective Supply Chain ModelRuoying Sun, Xingfen Wang, Gang Zhao. 193-194 [doi]
- Development of Fuzzy Software Operational ProfileK. Saravana Kumar, Ravindra Babu Misra, Neeraj Kumar Goyal. 195-196 [doi]
- Effect of Creep Properties on Pressure Induced Tin Whisker FormationTadahiro Shibutani, Qiang Yu, Masaki Shiratori. 197-198 [doi]
- Verifiable Aspect Composition in UML ModelsEunjee Song, Nathan V. Roberts. 201-202 [doi]
- A New Method for Measuring Single Event Effect Susceptibility of L1 Cache UnitYongbin Zhou, Jun Yang, Yueke Wang. 203-204 [doi]
- Detecting Emotions and Dangerous Actions for Better Human-System Team WorkingShuichi Fukuda. 205-206 [doi]
- Estimation of the Change Point for Failure-Censored Data via Bayesian Information CriterionNobuyuki Tamura, Tetsushi Yuge, Shigeru Yanagi. 207-208 [doi]
- Dependable Mechatronic Products: Closing the Intelligence GapNico Wolf, Jan C. Aurich. 209-210 [doi]
- System-Bus Fault Injection Framework in SystemC Design PlatformKun-Chun Chang, Yi-Chinag Wang, Chung-Hsien Hsu, Kuen-Long Leu, Yung-Yuan Chen. 211-212 [doi]
- Strategic Usage of Test Case Generation by Combining Two Test Case Generation ApproachesHaruka Nakao, Robert Eschbach. 213-214 [doi]
- An Experimental Study on Latch Up Failure of CMOS LSIHideo Kohinata, Masayuki Arai, Satoshi Fukumoto. 215-216 [doi]
- An Estimation Model of Vulnerability for Embedded MicroprocessorsYung-Yuan Chen, Shu-Hao Hsu, Kuen-Long Leu. 224-225 [doi]
- Early Reliability Prediction: An Approach to Software Reliability Assessment in Open Software Adoption StageWangbong Lee, Boo-Geum Jung, Jongmoon Baik. 226-227 [doi]
- Automation of Look-Up Tables for System Integrity Protection Systems in Taiwan Power SystemShih-En Chien, I-Ta Cherng, Chih-Wen Liu. 228-229 [doi]
- Face Detection Based on Skin Color Segmentation and SVM ClassificationHwei-Jen Lin, Shwu-Huey Yen, Jih Pin Yeh, Meng-Ju Lin. 230-231 [doi]