VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Youngsoo Shin, Chi-Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis, editors, VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers. Volume 483 of IFIP Advances in Information and Communication Technology, Springer, 2016. [doi]

Conference: vlsi2016