Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods

Mohand Bentobache, Ahcène Bounceur, Reinhardt Euler, Salvador Mir, Yann Kieffer. Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods. In Alex Orailoglu, H. Fatih Ugurdag, Luis Miguel Silveira, Martin Margala, Ricardo Reis, editors, VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and Extended Selected Papers. Volume 461 of IFIP Advances in Information and Communication Technology, pages 188-207, Springer, 2013. [doi]

Abstract

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