Jeanne Bickford, Nazmul Habib, John Goss, Robert McMahon, Rajiv V. Joshi, Rouwaida Kanj. Use of scalable Parametric Measurement Macro to improve semiconductor technology characterization and product test. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 315-319, IEEE, 2010. [doi]
Abstract is missing.