Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs - researchr publication

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Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier. Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectronics Reliability, 47(7):1069-1073, 2007. [doi]

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