Shih-Min Chao, Po-Juei Chen, Jing-yu Chen, Po-Hao Chen, Ang-Feng Lin, James Chien-Mo Li, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li. Divide and conquer diagnosis for multiple defects. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
Abstract is missing.