Optimum sampling for track PEB CD Integrated Metrology

Argon Chen, Sean Hsueh, Jakey Blue. Optimum sampling for track PEB CD Integrated Metrology. In IEEE Conference on Automation Science and Engineering, CASE 2009, Bangalore, India, 22-25 August, 2011. pages 439-442, IEEE, 2009. [doi]

Abstract

Abstract is missing.