Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto. Defect Analysis and Prediction by Applying the Multistage Software Reliability Growth Model. In 8th International Workshop on Empirical Software Engineering in Practice, IWESEP 2017, Tokyo, Japan, March 13, 2017. pages 7-11, IEEE, 2017. [doi]
Abstract is missing.