Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee. Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 337-342, IEEE Computer Society, 2010. [doi]
Abstract is missing.