Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang. Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. Microelectronics Reliability, 48(7):995-999, 2008. [doi]
Abstract is missing.