Fault isolation in nonlinear analog circuits with tolerance using the neural network-based L1-norm - researchr publication

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Yigang He, Yichuang Sun. Fault isolation in nonlinear analog circuits with tolerance using the neural network-based L1-norm. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 854-857, IEEE, 2001. [doi]

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