Predicting fault-prone modules based on metrics transitions

Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue. Predicting fault-prone modules based on metrics transitions. In Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann, editors, Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008. pages 6-10, ACM, 2008. [doi]

Abstract

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