Modeling Unreliable Data and Sensors: Using F-measure Attribute Performance with Test Samples from Low-Cost Sensors

Vasanth Iyer, S. Sitharama Iyengar. Modeling Unreliable Data and Sensors: Using F-measure Attribute Performance with Test Samples from Low-Cost Sensors. In Myra Spiliopoulou, Haixun Wang, Diane J. Cook, Jian Pei, Wei Wang 0010, Osmar R. Zaïane, Xindong Wu, editors, Data Mining Workshops (ICDMW), 2011 IEEE 11th International Conference on, Vancouver, BC, Canada, December 11, 2011. pages 15-22, IEEE, 2011. [doi]

Abstract

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