Ryan Kennedy, Jean H. Gallier, Jianbo Shi. Contour cut: Identifying salient contours in images by solving a Hermitian eigenvalue problem. In The 24th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2011, Colorado Springs, CO, USA, 20-25 June 2011. pages 2065-2072, IEEE, 2011. [doi]
Abstract is missing.