Manabu Kobayashi, Masayuki Goto, Toshiyasu Matsushima, Shigeichi Hirasawa. Robustness of syndrome analysis method in highly structured fault-diagnosis systems. In 2014 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2014, San Diego, CA, USA, October 5-8, 2014. pages 2757-2763, IEEE, 2014. [doi]
Abstract is missing.