Tien-Duy B. Le, David Lo, Ming Li 0005. Constrained feature selection for localizing faults. In Rainer Koschke, Jens Krinke, Martin P. Robillard, editors, 2015 IEEE International Conference on Software Maintenance and Evolution, ICSME 2015, Bremen, Germany, September 29 - October 1, 2015. pages 501-505, IEEE, 2015. [doi]
Abstract is missing.