Shanshan Liu, Liyi Xiao, Xuebing Cao, Zhigang Mao. Reliability analysis of memories suffering MBUs for the effect of negative bias temperature instability. In 22nd Asia and South Pacific Design Automation Conference, ASP-DAC 2017, Chiba, Japan, January 16-19, 2017. pages 87-92, IEEE, 2017. [doi]
Abstract is missing.