Design of a novel static-triggered power-rail ESD clamp circuit in a 65-nm CMOS process

Guangyi Lu, Yuan Wang, Lizhong Zhang, Jian Cao, Xing Zhang. Design of a novel static-triggered power-rail ESD clamp circuit in a 65-nm CMOS process. Science in China Series F: Information Sciences, 59(12), 2016. [doi]

Abstract

Abstract is missing.