Fraud detection in reputation systems in e-markets using logistic regression

Rafael Maranzato, Adriano M. Pereira, Alair Pereira do Lago, Marden Neubert. Fraud detection in reputation systems in e-markets using logistic regression. In Sung Y. Shin, Sascha Ossowski, Michael Schumacher, Mathew J. Palakal, Chih-Cheng Hung, editors, Proceedings of the 2010 ACM Symposium on Applied Computing (SAC), Sierre, Switzerland, March 22-26, 2010. pages 1454-1455, ACM, 2010. [doi]

Abstract

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