Jaechang Nam, Sinno Jialin Pan, Sunghun Kim. Transfer defect learning. In David Notkin, Betty H. C. Cheng, Klaus Pohl, editors, 35th International Conference on Software Engineering, ICSE '13, San Francisco, CA, USA, May 18-26, 2013. pages 382-391, IEEE / ACM, 2013. [doi]
Abstract is missing.