Analysis of OMPS in-flight CCD dark current degradation

C. Pan, F. Weng, T. Beck, D. Liang, E. Devaliere, W. Chen, S. Ding. Analysis of OMPS in-flight CCD dark current degradation. In 2016 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2016, Beijing, China, July 10-15, 2016. pages 1966-1969, IEEE, 2016. [doi]

Abstract

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