Automatically discovering design patterns and assessing concern separations for applications

Giuseppe Pappalardo, Emiliano Tramontana. Automatically discovering design patterns and assessing concern separations for applications. In Hisham Haddad, editor, Proceedings of the 2006 ACM Symposium on Applied Computing (SAC), Dijon, France, April 23-27, 2006. pages 1591-1596, ACM, 2006. [doi]

Abstract

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