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A Model to Estimate First-Order Mutation Coverage from Higher-Order Mutation Coverage

Ali Parsai, Alessandro Murgia, Serge Demeyer. A Model to Estimate First-Order Mutation Coverage from Higher-Order Mutation Coverage. In 2016 IEEE International Conference on Software Quality, Reliability and Security, QRS 2016, Vienna, Austria, August 1-3, 2016. pages 365-373, IEEE, 2016. [doi]

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