Flicker noise in advanced CMOS technology: Effects of halo implant

Navid Paydavosi, Sriramkumar Venugopalan, Angada B. Sachid, Ali Niknejad, Chenming Hu, Sagnik Dey, Samuel Martin, Xin Zhang. Flicker noise in advanced CMOS technology: Effects of halo implant. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 238-241, IEEE, 2013. [doi]

Abstract

Abstract is missing.