Transient response exploration of SRAM cell metastable states caused by ionizing radiation with 3D mixed mode simulation

A. Privat, L. T. Clark, Hugh J. Barnaby. Transient response exploration of SRAM cell metastable states caused by ionizing radiation with 3D mixed mode simulation. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 443-446, IEEE, 2014. [doi]

Abstract

Abstract is missing.